DEFINITIVE REFERENCE FOR INDIAN CENT DIE VARIETIES


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1887 Variety 20






Obverse 25

Reverse Z



Obverse Diagnostics



Date Position

Repunched 1 (Click Image To Enlarge)

Digit Punch Artifacts (Click Image To Enlarge)


Reverse Diagnostics



Reverse Z Die Crack Mapping


Obverse 25 is identified by date placement at C, date repunching that features an initial date impression to the south below the flag of the 1 and digit punch artifacts to the northwest of the lower loops of the 8 digits. Obverse 25 has acquired clash marks from a clashing event with Reverse Z.

Reverse Z has acquired two sets of clash marks, with one set acquired from a clashing event with Obverse 25 and the other set acquired during a previous die pairing.  Reverse Z has developed die cracking.

Comments:  The Obverse 25 artifacts located to the norhwest of the lower loops of the 8 digits originate from the digit punch that was utilied in 1887 to impress dates into the working dies.  Another 1887 obverse that exhibits these artifacts is Obverse 35 from the 1887 Variety 30 Die Pairing.

Variety 20 features a die state difference between Obverse 25 and Reverse Z, with Reverse Z exhibiting a later die state compared to Obverse 25. This die state difference indicates that Reverse Z was in service prior to Variety 20.

Plate Coin:  Courtesy of David Killough Collection, XF40

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